X-ray diffraction (XRD) analyses
The phase composition was measured by X-ray diffraction (X'Pert3 Powder instrument in Bragg-Brentan geometry using a Cu anode (U = 40 kV, I = 30 mA). Quantitative phase analysis was carried out using the whole pattern Rietveld refinement software MAUD.

Data files description

Txt. files show the original XRD data while first column represent the °2Theta, second column represents the intensity. 